IC Reliability Test
Reliability is a measure of product durability. Through reliability test, IC can find, analyze and evaluate the effective reasons of IC, so as to improve the reliability of IC products.
The failure causes of integrated circuits can be roughly divided into three stages:
Region (I) is known as the Infancy period. At this stage, the failure rate of products rapidly decreases. The reason for the failure is the defects in the IC design and production process;
Region (II) is called the Useful life period. At this stage, the failure rate of products remains stable, and the reasons for failure are often random, such as temperature change, etc;
Region (III) is called the Wear-Out period. The failure rate of products in this stage will rise rapidly. The reason for failure is the aging caused by long-term use of products.
Reliability Test Classification
1.Service life test
2.Environmental test items
