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Lab Companion Thermal Shock Test Chamber for Semiconductor Chip

On 2023-Mar-Tue

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Chip, also known as microchip, is the carrier of integrated circuits. Generally speaking, a chip (IC) refers to all semiconductor components, which are circuit modules that integrate multiple electronic components on a silicon board to achieve a specific function. It is the most important part of electronic equipment, undertaking the functions of computation and storage.

Temperature changes have a significant impact on the conductivity, limiting voltage, limiting current, switching characteristics, and switching characteristics of semiconductors. When the temperature is too high, the volume of components expands and compresses, and semiconductor chips may be scrapped due to cracks caused by extrusion. If the temperature is too low, it often causes the chip to be unable to open its internal semiconductor switch at the rated operating voltage, resulting in its inability to work properly.

Therefore, in the process of chip production, it is necessary to conduct thermal shock tests. In general, the normal temperature range for civilian chips is 0 ℃ - 70 ℃, while military chips have higher performance. The normal operating temperature range is - 55 ℃ - 125 ℃.

Thermal shock test chamber can provide an environment for electronic chips to undergo sudden temperature changes within a few seconds, and test the repeated tensile force of their materials against high and low temperatures, as well as the chemical changes or physical damage produced by the product during thermal expansion and contraction. Thermal shock test chambers are often used for adaptability testing, safety and reliability testing of electronic components, and product screening.

Lab Companion has focused on the research, development and production of reliability environmental testing equipment for 19 years, and thermal shock test chamber is also one of its main products. The thermal shock test chamber is divided into two- zone thermal shock test chambers and three-zone thermal shock test chambers. Meet the temperature shock of - 70~150 ℃, and the temperature sudden change time is completed within 10 seconds to 3 minutes. More electronic product chip reliability testing can be communicated with the professional team of Lab Companion.

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